Institute for Material Science Research Publikationen
Micro-Scale Residual Stress Measurement Using Focused Ion Beam Techniques and Digital Image Correlation

Micro-Scale Residual Stress Measurement Using Focused Ion Beam Techniques and Digital Image Correlation

Categories Konferenz
Year 2018
Authors Besserer, H.-B.; Rodman, D.
Published in In: QDE2018, International Conference on Quenching and Distortion Engineering. Nagoya, Japan, 27.11.-29.11.2018, S. 32