In-Situ Monitoring of the Microstructure Evolution Using Eddy Current Technology
| Categories |
Konferenz |
| Year | 2016 |
| Authors | Bruchwald, O.; Frackowiak, W.; Zwoch, S.; Reimche, W.; Maier, H. J. |
| Published in | Proceedings of the 19th World Conference on Non-Destructive Testing WCNDT, München, 2016 |
| ISBN | 978-3-940283-78-8 |
