Specimen Preparation by Ion Beam Slope Cutting for Characterization of Ductile Damage by Scanning Electron Microscopy
| Kategorien |
Zeitschriften/Aufsätze |
| Jahr | 2016 |
| Autoren | Besserer, H.-B.; Gerstein, G.; Maier, H. J.; Nürnberger, F. |
| Veröffentlicht in | Microsc. Res. Tech. 79, 2016 (4), 321-327 |
| DOI | 10.1002/jemt.22633 |
