ForschungPublikationen
Specimen Preparation by Ion Beam Slope Cutting for Characterization of Ductile Damage by Scanning Electron Microscopy

Specimen Preparation by Ion Beam Slope Cutting for Characterization of Ductile Damage by Scanning Electron Microscopy

Kategorien Zeitschriften/Aufsätze
Jahr 2016
Autoren Besserer, H.-B.; Gerstein, G.; Maier, H. J.; Nürnberger, F.
Veröffentlicht in Microsc. Res. Tech. 79, 2016 (4), 321-327
DOI 10.1002/jemt.22633