In the transmission electron microscope, very thin metal samples are irradiated with electrons. Here, resolutions of a some micrometers down to a few nanometers can be achieved. This makes it possible to detect precipitates, dislocations and grain boundaries.
In the transmission electron microscope, very thin metal samples are irradiated with electrons. Here, resolutions of a some micrometers down to a few nanometers can be achieved. This makes it possible to detect precipitates, dislocations and grain boundaries.
CONTACT PERSON FOR THE TECHNOLOGY OF MATERIALS (TW) DIVISION
Dr.-Ing. Sebastian Herbst
Management
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An der Universität 2
30823 Garbsen
30823 Garbsen
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Dr.-Ing. Sebastian Herbst
Management
