Institute for Material Science Research Publications
Qualifying Electrically Conductive Cold Embedding-Media for Scanning Electron Microscopy

Qualifying Electrically Conductive Cold Embedding-Media for Scanning Electron Microscopy

Categories Zeitschriften/Aufsätze
Year 2016
Authors Besserer, H.-B.; Boiarkin, V.; Rodman, D.; Nürnberger, F.
Published in Metallogr. Microstruct. Anal. 5, 2016 (4), 332-341
DOI 10.1007/s13632-016-0286-9