In Transmission Electron Microscopy (TEM), very thin metal samples are penetrated by electrons. This technique allows for resolutions ranging from a few micrometers down to a few nanometers. It enables the detection of precipitates, dislocations, and grain boundaries.
In Transmission Electron Microscopy (TEM), very thin metal samples are penetrated by electrons. This technique allows for resolutions ranging from a few micrometers down to a few nanometers. It enables the detection of precipitates, dislocations, and grain boundaries.
CONTACT TO THE MATERIALS TECHNOLOGY DIVISION
Dr.-Ing. Sebastian Herbst
Management
Phone
Fax
Email
Address
An der Universität 2
30823 Garbsen
30823 Garbsen
Building
Room
Dr.-Ing. Sebastian Herbst
Management
