The basis of many material properties lies in the crystalline structure of materials. The composition of phases within a material and their content can be crucial for mechanical strength. The characteristic crystal structure of materials can be visualized and analyzed through X-ray diffraction (XRD). Additionally, preferential orientations and residual stresses introduced by manufacturing processes can be determined. At IW, both minimal amounts of powder and components weighing up to 5 kg can be examined.
In addition, the imaging technique of X-ray microscopy (XRM) allows the investigation of material properties using X-rays similar to the CT method. In comparison to the CT method, significantly higher resolutions (up to 0.8 µm) are achieved, enabling the correlation of physical properties with the microstructure, such as examining grain size distribution, texture, or the distribution of features like pores.
The basis of many material properties lies in the crystalline structure of materials. The composition of phases within a material and their content can be crucial for mechanical strength. The characteristic crystal structure of materials can be visualized and analyzed through X-ray diffraction (XRD). Additionally, preferential orientations and residual stresses introduced by manufacturing processes can be determined. At IW, both minimal amounts of powder and components weighing up to 5 kg can be examined.
In addition, the imaging technique of X-ray microscopy (XRM) allows the investigation of material properties using X-rays similar to the CT method. In comparison to the CT method, significantly higher resolutions (up to 0.8 µm) are achieved, enabling the correlation of physical properties with the microstructure, such as examining grain size distribution, texture, or the distribution of features like pores.
CONTACT TO THE MATERIALS TECHNOLOGY DIVISION
30823 Garbsen
