FE-SEM Scanning Electron Microscope ZEISS Supra 55 VP [BITTE ALLES PRÜFEN!!]
- FE-REM, resolution 1.2 nm, beam current max. 100 nA
- Low vacuum mode
- Detectors: SE (chamber), InLens SE, VPSE, 4Q-BSD
- Analytics: EDX, EBSD (Bruker)
- In situ train/pressure module
Contact Person:
Dr.-Ing. Torsten Heidenblut
Management
Phone
Fax
Address
An der Universität 2
30823 Garbsen
30823 Garbsen
Building
Room
Dr.-Ing. Torsten Heidenblut
Management
